Senior Patent Engineer



Patrick is specialized in drafting patents in the field of microsystems, with particular focus on high tech patents involving micro-technologies, micro-optics, microelectronics, CMOS sensors and optical systems. He has a long experience in the innovation process and the strategic patent elaboration in these fields. He advises you on feasibility and protection of research and development projects, patent landscape of competitors, patentability of inventions and their drafting. He handles cases in English, French, German and Dutch.



  • Senior Patent Engineer


  • Aeronautics
  • Electronics
  • ICT
  • Mechanics
  • Microsystems technologies
  • Physics
  • Telecommunications


  • Master in Physics (with specialisation in crystallography, surface analysis techniques and optics), University of Ghent (Belgium)


  • Digital Holographic Microscopy (DHM) for metrology and dynamic characterisation of MEMS and MOEMS

    P. Debergh, Y. Emery et al., Proceedings SPIE 6186 II, pp.N1860-1862, April 21st, 2006

    Array of addressable contactless optical microshutters

    P. Debergh, S. Gonseth et al., Microsystem Technologies, Vol.11, issue 11, pp.1171-1175, October 2005

    Anodic oxydation effects in electrostatic microsutters

    P. Debergh, G. Perregaux, SPIE Conference on Test and Assembly of microsystems,Proceedings, Paris, May 2000

  • Fabrication of diffractive optical elements

    P. Debergh, P. Renault, Photonic West conference, Proceedings, San Fransisco, Januray 1996

    Applications of Diffractive optical elements

    P. Debergh, ICC conference Berlin , Proceedings, September 1996

    Photonic Microsystems based on artificial retinas

    P. Debergh, X. Arreguit, SPIE conference, Proceedings, June 1996

  • Solar sensor based on an artificial retina

    P. Debergh, P. Venier, X. Arreguit, Transducers Conference, proceedings, Stockholm, June 1995

    Capteur de courant à fibres optiques

    P. Debergh, bulletin service industriel genève, September 1993

    Integrated optical current sensor

    P. Debergh, O. Parriaux, ECIO conference, Proceedings p.12-36, Neuchâtel, 1993

  • Integrated optical reflectometer

    P. Debergh, G. Voirin, Conference MIrotechnologies Proceedings ICC Berlin, October 1990


  • Dutch
  • English
  • French
  • German
  • Italian
  • Spanish